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The Tap190 series silicon AFM probes with longer cantilever for tapping mode (Quesant AFM Systems). Made of monolithic silicon fitting most commercial AFMs, compatible with DI Nanoscope, PSI, JEOL, NT-MDT, Asylum, VEECO, WiTec and other commercial AFMs. The AFM cantilever and tip are micromachined with excellent uniformity and a sharp tip radius for high quality imaging. They feature alignment grooves for correct holding and calibration of probes (alignment grooves do not affect the AFM probe in systems that do not require this feature).

See images for AFM probes coatings and application information.

Технические характеристики

Technical Data: Tap190

  • Rotated monolithic silicon probe
  • Symmetric tip shape
  • Alignment grooves
  • Chip size 3.4 x 1.6 x 0.3mm

Value Range

  • Resonant Freq. 190 kHz +/-60 kHz
  • Force Constant 48 N/m 20-100 N/m
  • Length 225 µm +/-12 µm
  • Mean Width 38 µm +/-9 µm
  • Thickness 7 µm +/-1 µm
  • Tip Height 17 µm +/-2 µm
  • Tip Set Back 15 µm +/-5 µm
  • Tip Radius <10 nm (G, AL-G, GD-G)
  • <25nm (Electri)
  • <15nm (DLC)
  • Half Cone Angle 20°-25° along cantilever axis
  • 25°-30° from side
  • 10°-at the apex
  • Contact Resistance 300 ohms on platinum thin film surface
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